Probert, Michael R. (2005) Towards a fuller understanding of selected molecular compounds. Doctoral thesis, Durham University.
|Archive (ZIP) (Research sample crystallographic tables and service sample crystallographic tables.) - Supplemental Material|
This work is separated into two distinct sections. The first section deals with the analysis by variable temperature single crystal X-ray diffraction of crystalline molecular materials with novel physical properties. The second section details the electron density analysis of selected crystalline compounds using high resolution, low temperature single crystal X-ray diffraction. Chapter 1 provides introduction to X-ray diffraction outlining the theory this work is based on. Chapter 2 introduces the molecular material studies based on materials containing the bis(ethylenedithio)-tetrathiaftilvalene molecule. The aim of these studies was to achieve a greater understanding of the materials and the changes they undergo when exposed to variations in temperature whilst in the crystalline state. These structural changes observed are very minor but have dramatic effects on the electrical properties of the materials studied. It became apparent that the only way to form a full understanding of these materials was to be able to 'see' the electronic configuration of the materials, not just their gross structure. The field of electron density analysis by X- ray diffraction is now a well documented area. Chapter 4 provides an introduction to the field of electron density analysis. Diffraction experiments were conducted on systems of different complexity to investigate this field and these results are reported in Chapter 5. No electron density analyses have been conducted on the molecular materials studied in Chapter 3 as yet, due to the lack of crystals of suitable quality. It was also noted that to fully categorise the nature of the physical changes occurring in these structures that a diffractometer capable of analysing these samples throughout the temperature range of their physical phenomena was needed. An outline for the development of such a diffractometer is detailed in Chapter 6, 'future works'.
|Item Type:||Thesis (Doctoral)|
|Award:||Doctor of Philosophy|
|Copyright:||Copyright of this thesis is held by the author|
|Deposited On:||08 Sep 2011 18:31|