Durham e-Theses
You are in:

Modelling and analysis of failures in CMOS integrated cirucuits.

Johnson, Simon (1993) Modelling and analysis of failures in CMOS integrated cirucuits. Doctoral thesis, Durham University.

[img]
Preview
PDF
22Mb

Item Type:Thesis (Doctoral)
Award:Doctor of Philosophy
Keywords:Electric apparatus and appliances Electronic apparatus and appliances Electric circuits Electronic circuits
Thesis Date:1993
Copyright:Copyright of this thesis is held by the author
Deposited On:05 Sep 2011 17:15

Social bookmarking: del.icio.usConnoteaBibSonomyCiteULikeFacebookTwitter